| |
| 2003 | ||
|---|---|---|
| 1 | EE | N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva: Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. Microelectronics Reliability 43(1): 57-60 (2003) |
| 1 | J. Brini | [1] |
| 2 | C. A. Dimitriadis | [1] |
| 3 | V. K. Gueorguiev | [1] |
| 4 | N. A. Hastas | [1] |
| 5 | G. Kamarinos | [1] |