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L. Montès

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2005
1EEE. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005)

Coauthor Index

1S. Bécu [1]
2S. Blonkowski [1]
3S. Bruyère [1]
4S. Crémer [1]
5E. Deloffre [1]
6G. Ghibaudo [1]
7M. Gros-Jean [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)