| 2005 |
|---|
| 5 | EE | Prasad Chaparala,
Douglas Brisbin:
Impact of NBTI and HCI on PMOSFET threshold voltage drift.
Microelectronics Reliability 45(1): 13-18 (2005) |
| 4 | EE | Douglas Brisbin,
Andy Strachan,
Prasad Chaparala:
Optimizing the hot carrier reliability of N-LDMOS transistor arrays.
Microelectronics Reliability 45(7-8): 1021-1032 (2005) |
| 2004 |
|---|
| 3 | EE | M. M. De Souza,
S. K. Manhas,
D. Chandra Sekhar,
A. S. Oates,
Prasad Chaparala:
Influence of mobility model on extraction of stress dependent source-drain series resistance.
Microelectronics Reliability 44(1): 25-32 (2004) |
| 2 | EE | Barry O'Connell,
Prasad Chaparala,
Bhola Mehrotra:
Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques.
Microelectronics Reliability 44(8): 1263-1268 (2004) |
| 2002 |
|---|
| 1 | EE | Douglas Brisbin,
Prasad Chaparala:
Influence of test techniques on soft breakdown detection in ultra-thin oxides.
Microelectronics Reliability 42(1): 35-39 (2002) |
