| |
| 2005 | ||
|---|---|---|
| 3 | EE | Prasad Chaparala, Douglas Brisbin: Impact of NBTI and HCI on PMOSFET threshold voltage drift. Microelectronics Reliability 45(1): 13-18 (2005) |
| 2 | EE | Douglas Brisbin, Andy Strachan, Prasad Chaparala: Optimizing the hot carrier reliability of N-LDMOS transistor arrays. Microelectronics Reliability 45(7-8): 1021-1032 (2005) |
| 2002 | ||
| 1 | EE | Douglas Brisbin, Prasad Chaparala: Influence of test techniques on soft breakdown detection in ultra-thin oxides. Microelectronics Reliability 42(1): 35-39 (2002) |
| 1 | Prasad Chaparala | [1] [2] [3] |
| 2 | Andy Strachan | [2] |