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Douglas Brisbin

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2005
3EEPrasad Chaparala, Douglas Brisbin: Impact of NBTI and HCI on PMOSFET threshold voltage drift. Microelectronics Reliability 45(1): 13-18 (2005)
2EEDouglas Brisbin, Andy Strachan, Prasad Chaparala: Optimizing the hot carrier reliability of N-LDMOS transistor arrays. Microelectronics Reliability 45(7-8): 1021-1032 (2005)
2002
1EEDouglas Brisbin, Prasad Chaparala: Influence of test techniques on soft breakdown detection in ultra-thin oxides. Microelectronics Reliability 42(1): 35-39 (2002)

Coauthor Index

1Prasad Chaparala [1] [2] [3]
2Andy Strachan [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)