Andy Strachan
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2005
1
EE
Douglas Brisbin
, Andy Strachan,
Prasad Chaparala
: Optimizing the hot carrier reliability of N-LDMOS transistor arrays.
Microelectronics Reliability 45
(7-8): 1021-1032 (2005)
Coauthor
Index
1
Douglas Brisbin
[
1
]
2
Prasad Chaparala
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
