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| 2004 | ||
|---|---|---|
| 1 | EE | Barry O'Connell, Prasad Chaparala, Bhola Mehrotra: Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. Microelectronics Reliability 44(8): 1263-1268 (2004) |
| 1 | Prasad Chaparala | [1] |
| 2 | Barry O'Connell | [1] |