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2004 | ||
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1 | EE | Barry O'Connell, Prasad Chaparala, Bhola Mehrotra: Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. Microelectronics Reliability 44(8): 1263-1268 (2004) |
1 | Prasad Chaparala | [1] |
2 | Barry O'Connell | [1] |