Barry O'Connell

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2004

1 EE Barry O'Connell, Prasad Chaparala, Bhola Mehrotra: Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. Microelectronics Reliability 44(8): 1263-1268 (2004)

2004
1	EE	Barry O'Connell, Prasad Chaparala, Bhola Mehrotra: Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. Microelectronics Reliability 44(8): 1263-1268 (2004)

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