| |
| 2004 | ||
|---|---|---|
| 2 | EE | M. M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala: Influence of mobility model on extraction of stress dependent source-drain series resistance. Microelectronics Reliability 44(1): 25-32 (2004) |
| 2003 | ||
| 1 | EE | S. K. Manhas, D. Chandra Sekhar, A. S. Oates, M. M. De Souza: Characterisation of series resistance degradation through charge pumping technique. Microelectronics Reliability 43(4): 617-624 (2003) |
| 1 | Prasad Chaparala | [2] |
| 2 | S. K. Manhas | [1] [2] |
| 3 | A. S. Oates | [1] [2] |
| 4 | M. M. De Souza | [1] [2] |