| 2001 |
|---|
| 5 | EE | K. Krieg,
D. J. Thomson,
Gregory E. Bridges:
Electrical probing of deep sub-micron integrated circuits using scanning probes.
Microelectronics Reliability 41(8): 1185-1191 (2001) |
| 1996 |
|---|
| 4 | EE | Zaifu Zhang,
Robert D. McLeod,
Gregory E. Bridges:
Statistical estimation of delay fault detectabilities and fault grading.
J. Electronic Testing 8(1): 47-60 (1996) |
| 1995 |
|---|
| 3 | EE | Zaifu Zhang,
Robert D. McLeod,
Gregory E. Bridges:
Statistical estimation of delay fault detectabilities and fault grading.
Great Lakes Symposium on VLSI 1995: 184-187 |
| 2 | EE | H. Zhou,
Howard C. Card,
Gregory E. Bridges:
Parallel pseudorandom number generation in GaAs cellular automata for high speed circuit testing.
J. Electronic Testing 6(3): 325-330 (1995) |
| 1986 |
|---|
| 1 | | Gregory E. Bridges,
Werner Pries,
Robert D. McLeod,
M. Yunik,
P. Glenn Gulak,
Howard C. Card:
Dual Systolic Architectures for VLSI Digital Signal Processing Systems.
IEEE Trans. Computers 35(10): 916-923 (1986) |
