D. J. Thomson
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2001
1
EE
K. Krieg
, D. J. Thomson,
Gregory E. Bridges
: Electrical probing of deep sub-micron integrated circuits using scanning probes.
Microelectronics Reliability 41
(8): 1185-1191 (2001)
Coauthor
Index
1
Gregory E. Bridges
[
1
]
2
K. Krieg
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
