2007 |
10 | EE | Huiru Zheng,
R. J. Davies,
T. Stone,
S. Wilson,
J. Hammerton,
Sue J. Mawson,
P. M. Ware,
Norman D. Black,
N. D. Harris,
Chris Eccleston,
H. Hu,
H. Zhou,
Gail A. Mountain:
SMART Rehabilitation: Implementation of ICT Platform to Support Home-Based Stroke Rehabilitation.
HCI (5) 2007: 831-840 |
2004 |
9 | EE | C. J. Zheng,
H. Zhou,
B. Xie,
L. Y. Han,
Chun Wei Yap,
Yu Zong Chen:
TRMP: a database of therapeutically relevant multiple pathways.
Bioinformatics 20(14): 2236-2241 (2004) |
8 | EE | B. Wang,
Ruzhi Wang,
H. Zhou,
X. H. Yan,
J. X. Cao,
H. Wang,
H. Yan:
Field emission mechanism from nanocrystalline cubic boron nitride films.
Microelectronics Journal 35(4): 371-374 (2004) |
7 | EE | H. Zhou,
F. G. Shi,
B. Zhao,
J. Yota:
Effect of deposition methods on dielectric breakdown strength of PECVD low-k carbon doped silicon dioxide dielectric thin films.
Microelectronics Journal 35(7): 571-576 (2004) |
6 | | Z. W. Cao,
Ying Xue,
L. Y. Han,
B. Xie,
H. Zhou,
C. J. Zheng,
H. H. Lin,
Yu Zong Chen:
MoViES: molecular vibrations evaluation server for analysis of fluctuational dynamics of proteins and nucleic acids.
Nucleic Acids Research 32(Web-Server-Issue): 679-685 (2004) |
2003 |
5 | EE | H. Zhou,
F. G. Shi,
B. Zhao:
Thickness dependent dielectric breakdown of PECVD low-k carbon doped silicon dioxide dielectric thin films: modeling and experiments.
Microelectronics Journal 34(4): 259-264 (2003) |
2000 |
4 | EE | Ashraf A. Kassim,
H. Zhou,
S. Ranganath:
Automatic IC orientation checks.
Mach. Vis. Appl. 12(3): 107-112 (2000) |
1998 |
3 | EE | H. Zhou,
Ashraf A. Kassim,
S. Ranganath:
A fast algorithm for detecting die extrusion defects in IC packages.
Mach. Vis. Appl. 11(1): 37-41 (1998) |
1995 |
2 | EE | L. Haddad,
H. Zhou:
Star chromatic numbers of hypergraphs and partial Steiner triple systems.
Discrete Mathematics 146(1-3): 45-58 (1995) |
1 | EE | H. Zhou,
Howard C. Card,
Gregory E. Bridges:
Parallel pseudorandom number generation in GaAs cellular automata for high speed circuit testing.
J. Electronic Testing 6(3): 325-330 (1995) |