2006 | ||
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1 | EE | Y. Guhel, B. Boudart, E. Delos, M. Germain, Z. Bougrioua: Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N. Microelectronics Reliability 46(5-6): 786-793 (2006) |
1 | B. Boudart | [1] |
2 | Z. Bougrioua | [1] |
3 | M. Germain | [1] |
4 | Y. Guhel | [1] |