| |
| 2005 | ||
|---|---|---|
| 1 | EE | C. O. Maïga, Hamid Toutah, Boubekeur Tala-Ighil, B. Boudart: Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectronics Reliability 45(9-11): 1728-1731 (2005) |
| 1 | B. Boudart | [1] |
| 2 | Boubekeur Tala-Ighil | [1] |
| 3 | Hamid Toutah | [1] |