| 2006 |
|---|
| 8 | EE | Thomas S. Barnett,
Matt Grady,
Kathleen G. Purdy,
Adit D. Singh:
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction.
IEEE Design & Test of Computers 23(2): 110-116 (2006) |
| 2003 |
|---|
| 7 | EE | Thomas S. Barnett,
Adit D. Singh:
Relating Yield Models to Burn-In Fall-Out in Time.
ITC 2003: 77-84 |
| 6 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability.
IEEE Transactions on Reliability 52(3): 296-300 (2003) |
| 2002 |
|---|
| 5 | EE | Thomas S. Barnett,
Matt Grady,
Kathleen G. Purdy,
Adit D. Singh:
Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model.
ITC 2002: 693-699 |
| 4 | EE | Thomas S. Barnett,
Adit D. Singh,
Matt Grady,
Kathleen G. Purdy:
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction.
VTS 2002: 75-80 |
| 2001 |
|---|
| 3 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.
DFT 2001: 29-38 |
| 2 | | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Estimating burn-in fall-out for redundant memory.
ITC 2001: 340-347 |
| 1 | EE | Thomas S. Barnett,
Adit D. Singh,
Victor P. Nelson:
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.
VTS 2001: 326-332 |
