| |
| 2006 | ||
|---|---|---|
| 3 | EE | Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh: Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Design & Test of Computers 23(2): 110-116 (2006) |
| 2002 | ||
| 2 | EE | Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh: Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. ITC 2002: 693-699 |
| 1 | EE | Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy: Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. VTS 2002: 75-80 |
| 1 | Thomas S. Barnett | [1] [2] [3] |
| 2 | Matt Grady | [1] [2] [3] |
| 3 | Adit D. Singh | [1] [2] [3] |