Sang Phill Park

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3EEKunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731
2EEJaydeep P. Kulkarni, Keejong Kim, Sang Phill Park, Kaushik Roy: Process variation tolerant SRAM array for ultra low voltage applications. DAC 2008: 108-113
1EEKunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD 2007: 730-734

Coauthor Index

1Muhammad Ashraful Alam [1]
2Saakshi Gangwal [3]
3Kunhyuk Kang [1] [3]
4Keejong Kim [2]
5Jaydeep P. Kulkarni [2]
6Kaushik Roy [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)