Sang Phill Park

2008
3	EE	Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731
2	EE	Jaydeep P. Kulkarni, Keejong Kim, Sang Phill Park, Kaushik Roy: Process variation tolerant SRAM array for ultra low voltage applications. DAC 2008: 108-113
2007
1	EE	Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD 2007: 730-734

Coauthor Index

1	Muhammad Ashraful Alam	[1]
2	Saakshi Gangwal	[3]
3	Kunhyuk Kang	[1] [3]
4	Keejong Kim	[2]
5	Jaydeep P. Kulkarni	[2]
6	Kaushik Roy	[1] [2] [3]