| |
| 2007 | ||
|---|---|---|
| 1 | EE | Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy: Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. DAC 2007: 358-363 |
| 1 | Muhammad Ashraful Alam | [1] |
| 2 | Kunhyuk Kang | [1] |
| 3 | Kee-Jong Kim | [1] |
| 4 | Kaushik Roy | [1] |