| 2008 |
|---|
| 9 | EE | Chong Zhao,
Yi Zhao,
Sujit Dey:
Intelligent Robustness Insertion for Optimal Transient Error Tolerance Improvement in VLSI Circuits.
IEEE Trans. VLSI Syst. 16(6): 714-724 (2008) |
| 8 | EE | Fan Zhang,
Hanqiu Sun,
Chong Zhao,
Lifeng Wang:
Generalized minimum-norm perspective shadow maps.
Journal of Visualization and Computer Animation 19(5): 553-567 (2008) |
| 2007 |
|---|
| 7 | EE | Chong Zhao,
Sujit Dey:
Modeling soft error effects considering process variations.
ICCD 2007: 376-381 |
| 6 | EE | Fan Zhang,
Hanqiu Sun,
Chong Zhao,
Lifeng Wang:
Theory to Practice: Generalized Minimum-Norm Perspective Shadow Maps for Anti-aliased Shadow Rendering in 3D Computer Games.
ICEC 2007: 66-78 |
| 5 | EE | Chong Zhao,
Xiaoliang Bai,
Sujit Dey:
Evaluating Transient Error Effects in Digital Nanometer Circuits.
IEEE Transactions on Reliability 56(3): 381-391 (2007) |
| 2006 |
|---|
| 4 | EE | Chong Zhao,
Sujit Dey:
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO).
ISQED 2006: 133-140 |
| 2005 |
|---|
| 3 | EE | Chong Zhao,
Yi Zhao,
Sujit Dey:
Constraint-aware robustness insertion for optimal noise-tolerance enhancement in VLSI circuits.
DAC 2005: 190-195 |
| 2 | EE | Chong Zhao,
Sujit Dey,
Xiaoliang Bai:
Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits.
IEEE Design & Test of Computers 22(4): 362-375 (2005) |
| 2004 |
|---|
| 1 | EE | Chong Zhao,
Xiaoliang Bai,
Sujit Dey:
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits.
DAC 2004: 894-899 |
