2008 |
5 | EE | Junichi Fujikata,
Kenichi Nishi,
Akiko Gomyo,
Jun Ushida,
Tsutomu Ishi,
Hiroaki Yukawa,
Daisuke Okamoto,
Masafumi Nakada,
Takanori Shimizu,
Masao Kinoshita,
Koichi Nose,
Masayuki Mizuno,
Tai Tsuchizawa,
Toshifumi Watanabe,
Koji Yamada,
Seiichi Itabashi,
Keishi Ohashi:
LSI On-Chip Optical Interconnection with Si Nano-Photonics.
IEICE Transactions 91-C(2): 131-137 (2008) |
4 | EE | Sungbong Park,
Yasuhiko Ishikawa,
Tai Tsuchizawa,
Toshifumi Watanabe,
Koji Yamada,
Seiichi Itabashi,
Kazumi Wada:
Effect of Post-Growth Annealing on Morphology of Ge Mesa Selectively Grown on Si.
IEICE Transactions 91-C(2): 181-186 (2008) |
2002 |
3 | EE | Koji Asami,
Yasuo Furukawa,
Michael Purtell,
Motoo Ueda,
Karl Watanabe,
Toshifumi Watanabe:
WCDMA Testing with a Baseband/IF Range AWG.
ITC 2002: 1140-1145 |
2000 |
2 | | Takahiro J. Yamaguchi,
Mani Soma,
David Halter,
Jim Nissen,
Rajesh Raina,
Masahiro Ishida,
Toshifumi Watanabe:
Jitter measurements of a PowerPCTM microprocessor using an analytic signal method.
ITC 2000: 955-964 |
1 | EE | Takahiro J. Yamaguchi,
Masahiro Ishida,
Mani Soma,
Toshifumi Watanabe,
Tadahiro Ohmi:
Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.
VTS 2000: 395-402 |