2007 | ||
---|---|---|
3 | EE | Shalabh Goyal, Abhijit Chatterjee, Michael Purtell: A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electronic Testing 23(1): 95-106 (2007) |
2005 | ||
2 | EE | Shalabh Goyal, Michael Purtell: Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. Asian Test Symposium 2005: 14-17 |
2002 | ||
1 | EE | Koji Asami, Yasuo Furukawa, Michael Purtell, Motoo Ueda, Karl Watanabe, Toshifumi Watanabe: WCDMA Testing with a Baseband/IF Range AWG. ITC 2002: 1140-1145 |
1 | Koji Asami | [1] |
2 | Abhijit Chatterjee | [3] |
3 | Yasuo Furukawa | [1] |
4 | Shalabh Goyal | [2] [3] |
5 | Motoo Ueda | [1] |
6 | Karl Watanabe | [1] |
7 | Toshifumi Watanabe | [1] |