2008 |
54 | EE | Adam W. M. van Eekeren,
Klamer Schutte,
Lucas J. van Vliet:
Super-Resolution on small moving objects.
ICIP 2008: 1248-1251 |
53 | EE | Vincent Frans van Ravesteijn,
Frans M. Vos,
Iwo Serlie,
Roel Truyen,
Lucas J. van Vliet:
Thin layer tissue classification for electronic cleansing of CT colonography data.
ICPR 2008: 1-5 |
52 | EE | Matthan Caan,
Lucas J. van Vliet,
Charles B. L. M. Majoie,
Eline Aukema,
Kees Grimbergen,
Frans Vos:
Spatial Consistency in 3D Tract-Based Clustering Statistics.
MICCAI (1) 2008: 535-542 |
2007 |
51 | EE | Frank G. A. Faas,
Lucas J. van Vliet:
A Crossing Detector Based on the Structure Tensor.
ACIVS 2007: 212-220 |
50 | EE | Frank G. A. Faas,
Lucas J. van Vliet:
Junction Detection and Multi-orientation Analysis Using Streamlines.
CAIP 2007: 718-725 |
49 | EE | Matthan Caan,
Koen Vermeer,
Lucas J. van Vliet,
Kees Grimbergen,
Frans Vos:
Pruning Datasets in Discriminant Analysis: A DTI Study to Schizophrenia.
ISBI 2007: 1340-1344 |
48 | EE | Martijn van de Giessen,
Frans Vos,
Simon D. Strackee,
Mario Maas,
Cornelis A. Grimbergen,
Lucas J. van Vliet,
Geert J. Streekstra:
Constrained Registration of Multiple Rigid Objects in Close Proximity: Application in the Wrist Joint.
ISBI 2007: 704-707 |
47 | EE | Frans Vos,
Matthan Caan,
Koen Vermeer,
Charles B. L. M. Majoie,
G. J. den Heeten,
Lucas J. van Vliet:
Linear and Kernel Fisher Discriminant Analysis for Studying Diffusion Tensor Images in Schizophrenia.
ISBI 2007: 764-767 |
46 | EE | Matthan Caan,
Anne Willem de Vries,
Ganesh Khedoe,
Erik Akkerman,
Lucas J. van Vliet,
Kees Grimbergen,
Frans Vos:
Generating Fiber Crossing Phantoms Out of Experimental DWIs.
MICCAI (1) 2007: 169-176 |
45 | EE | R. Joop van Heekeren,
Frank G. A. Faas,
Lucas J. van Vliet:
Finding the Minimum-Cost Path Without Cutting Corners.
SCIA 2007: 263-272 |
44 | EE | Iwo Serlie,
Frans Vos,
Roel Truyen,
Frits H. Post,
Lucas J. van Vliet:
Classifying CT Image Data Into Material Fractions by a Scale and Rotation Invariant Edge Model.
IEEE Transactions on Image Processing 16(12): 2891-2904 (2007) |
43 | EE | Cris L. Luengo Hendriks,
Geert M. P. van Kempen,
Lucas J. van Vliet:
Improving the accuracy of isotropic granulometries.
Pattern Recognition Letters 28(7): 865-872 (2007) |
2006 |
42 | EE | Adam W. M. van Eekeren,
Klamer Schutte,
Judith Dijk,
Dirk-Jan J. de Lange,
Lucas J. van Vliet:
Super-Resolution on Moving Objects and Background.
ICIP 2006: 2709-2712 |
41 | EE | Lucas J. van Vliet,
Frank G. A. Faas:
Multi-orientation analysis by decomposing the structure tensor and clustering.
ICPR (3) 2006: 856-860 |
40 | EE | Cees van Wijk,
Vincent Frans van Ravesteijn,
Frans Vos,
Roel Truyen,
Ayso H. de Vries,
Jaap Stoker,
Lucas J. van Vliet:
Detection of Protrusions in Curved Folded Surfaces Applied to Automated Polyp Detection in CT Colonography.
MICCAI (2) 2006: 471-478 |
39 | EE | Koen Vermeer,
Frans Vos,
B. Lo,
Qienyuan Zhou,
Hans Lemij,
Albert M. Vossepoel,
Lucas J. van Vliet:
Modeling of scanning laser polarimetry images of the human retina for progression detection of glaucoma.
IEEE Trans. Med. Imaging 25(5): 517-528 (2006) |
38 | EE | Nicole J. J. P. Koenderink,
Jan L. Top,
Lucas J. van Vliet:
Supporting knowledge-intensive inspection tasks with application ontologies.
International Journal of Man-Machine Studies 64(10): 974-983 (2006) |
2005 |
37 | EE | Nicole J. J. P. Koenderink,
Jan L. Top,
Lucas J. van Vliet:
Expert-Based Ontology Construction: A Case-Study in Horticulture.
DEXA Workshops 2005: 383-387 |
36 | EE | Tuan Q. Pham,
Lucas J. van Vliet:
Separable bilateral filtering for fast video preprocessing.
ICME 2005: 454-457 |
35 | EE | J. J. Dijkers,
Cees van Wijk,
Frans Vos,
Jasper Florie,
Y. C. Nio,
Henk W. Venema,
Roel Truyen,
Lucas J. van Vliet:
Segmentation and Size Measurement of Polyps in CT Colonography.
MICCAI 2005: 712-719 |
34 | EE | Cris L. Luengo Hendriks,
Lucas J. van Vliet:
Using Line Segments as Structuring Elements for Sampling-Invariant Measurements.
IEEE Trans. Pattern Anal. Mach. Intell. 27(11): 1826-1831 (2005) |
33 | EE | Henri Bouma,
Anna Vilanova,
Lucas J. van Vliet,
Frans A. Gerritsen:
Correction for the Dislocation of Curved Surfaces Caused by the PSF in 2D and 3D CT Images.
IEEE Trans. Pattern Anal. Mach. Intell. 27(9): 1501-1507 (2005) |
32 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The generalized Radon transform: Sampling, accuracy and memory considerations.
Pattern Recognition 38(12): 2494-2505 (2005) |
2004 |
31 | EE | Lucas J. van Vliet:
Robust Local Max-Min Filters by Normalized Power-Weighted Filtering.
ICPR (1) 2004: 696-699 |
30 | EE | Frans Vos,
Paul W. de Bruin,
J. G. M. Aubel,
Geert J. Streekstra,
Mario Maas,
Lucas J. van Vliet,
Albert M. Vossepoel:
A Statistical Shape Model without Using Landmarks.
ICPR (3) 2004: 714-717 |
29 | | Lucas J. van Vliet,
Piet W. Verbeek,
Ian T. Young:
Quantitative Imaging: How to Measure Size Features in Digitized Images.
ISBI 2004: 1227-1230 |
28 | EE | Cees van Wijk,
Roel Truyen,
Rogier E. van Gelder,
Lucas J. van Vliet,
Frans Vos:
On Normalized Convolution to Measure Curvature Features for Automatic Polyp Detection.
MICCAI (1) 2004: 200-208 |
27 | EE | Bernd Rieger,
Frederik J. Timmermans,
Lucas J. van Vliet,
Piet W. Verbeek:
On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors.
IEEE Trans. Pattern Anal. Mach. Intell. 26(8): 1088-1094 (2004) |
26 | EE | Bernd Rieger,
Lucas J. van Vliet:
A systematic approach to nD orientation representation.
Image Vision Comput. 22(6): 453-459 (2004) |
2003 |
25 | EE | Judith Dijk,
Michael van Ginkel,
Rutger J. van Asselt,
Lucas J. van Vliet,
Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges.
CAIP 2003: 149-156 |
24 | EE | Bernd Rieger,
Lucas J. van Vliet:
Representing Orientation in n-Dimensional Spaces.
CAIP 2003: 17-24 |
23 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The Generalised Radon Transform: Sampling and Memory Considerations.
CAIP 2003: 681-688 |
22 | EE | Cris L. Luengo Hendriks,
Lucas J. van Vliet:
Discrete Morphology with Line Structuring Elements.
CAIP 2003: 722-729 |
21 | EE | Iwo Serlie,
Roel Truyen,
Jasper Florie,
Frits H. Post,
Lucas J. van Vliet,
Frans Vos:
Computed Cleansing for Virtual Colonoscopy Using a Three-Material Transition Model.
MICCAI (2) 2003: 175-183 |
20 | EE | Michael van Ginkel,
M. A. Kraaijveld,
Lucas J. van Vliet,
E. P. Reding,
Piet W. Verbeek,
H. J. Lammers:
Robust Curve Detection Using a Radon Transform in Orientation Space.
SCIA 2003: 125-132 |
19 | EE | Bernd Rieger,
Lucas J. van Vliet,
Piet W. Verbeek:
Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images.
SCIA 2003: 262-267 |
18 | EE | Frank G. A. Faas,
Lucas J. van Vliet:
3D-Orientation Space; Filters and Sampling.
SCIA 2003: 36-42 |
17 | EE | Tuan Q. Pham,
Lucas J. van Vliet:
Normalized Averaging Using Adaptive Applicability Functions with Applications in Image Reconstruction from Sparsely and Randomly Sampled Data.
SCIA 2003: 485-492 |
16 | EE | Cris L. Luengo Hendriks,
Lucas J. van Vliet:
Basic Morphological Operations, Band-Limited Images and Sampling.
Scale-Space 2003: 313-324 |
2002 |
15 | EE | Bernd Rieger,
Frederik J. Timmermans,
Lucas J. van Vliet,
Piet W. Verbeek:
Curvature Estimation of Surfaces in 3D Grey-Value Images.
ICPR (1) 2002: 684-687 |
14 | EE | Bernd Rieger,
Lucas J. van Vliet:
Curvature of n-dimensional space curves in grey-value images.
IEEE Transactions on Image Processing 11(7): 738-745 (2002) |
2001 |
13 | | Peter Bakker,
Lucas J. van Vliet,
Piet W. Verbeek:
Confidence and Curvature Estimation of Curvilinear Structures in 3-D.
ICCV 2001: 139-144 |
12 | EE | Cris L. Luengo Hendriks,
Lucas J. van Vliet:
A Rotation-Invariant Morphology for Shape Analysis of Anisotropic Objects and Structures.
IWVF 2001: 378-387 |
11 | EE | Cris L. Luengo Hendriks,
Lucas J. van Vliet:
Segmentation-Free Estimation of Length Distributions Using Sieves and RIA Morphology.
Scale-Space 2001: 398-406 |
10 | EE | Joost van de Weijer,
Lucas J. van Vliet,
Piet W. Verbeek,
Michael van Ginkel:
Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.
IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001) |
2000 |
9 | EE | L. R. Van den Doel,
Lucas J. van Vliet,
K. T. Hjelt,
M. J. Vellekoop,
Ian T. Young,
F. Gromball,
Jan G. Korvink:
Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis.
ICPR 2000: 3057-3062 |
8 | EE | Ian T. Young,
Lucas J. van Vliet,
Michael van Ginkel:
Recursive Gabor Filtering.
ICPR 2000: 3342-3345 |
1999 |
7 | EE | Peter Bakker,
Lucas J. van Vliet,
Piet W. Verbeek:
Edge Preserving Orientation Adaptive Filtering.
CVPR 1999: 1535-1540 |
1998 |
6 | | Dick de Ridder,
Robert P. W. Duin,
Piet W. Verbeek,
Lucas J. van Vliet:
On the Application of Neural Networks to Non-Linear Image Processing Tasks.
ICONIP 1998: 161-165 |
5 | EE | Frank de Jong,
Lucas J. van Vliet,
Pieter P. Jonker:
Gradient Estimation in Uncertain Data.
MVA 1998: 144-147 |
1994 |
4 | EE | Piet W. Verbeek,
Lucas J. van Vliet:
On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images.
IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 726-733 (1994) |
3 | EE | Lucas J. van Vliet,
Piet W. Verbeek:
Edge localization by MoG filters: Multiple-of-Gaussians.
Pattern Recognition Letters 15(5): 485-496 (1994) |
1993 |
2 | | Ben J. H. Verwer,
Lucas J. van Vliet,
Piet W. Verbeek:
Binary and Grey-Value Skeletons: Metrics and Algorithms.
IJPRAI 7(5): 1287-1308 (1993) |
1989 |
1 | EE | Lucas J. van Vliet,
Ian T. Young,
Guus L. Beckers:
A nonlinear laplace operator as edge detector in noisy images.
Computer Vision, Graphics, and Image Processing 45(2): 167-195 (1989) |