| 2005 |
|---|
| 6 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The generalized Radon transform: Sampling, accuracy and memory considerations.
Pattern Recognition 38(12): 2494-2505 (2005) |
| 2003 |
|---|
| 5 | EE | Judith Dijk,
Michael van Ginkel,
Rutger J. van Asselt,
Lucas J. van Vliet,
Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges.
CAIP 2003: 149-156 |
| 4 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The Generalised Radon Transform: Sampling and Memory Considerations.
CAIP 2003: 681-688 |
| 3 | EE | Michael van Ginkel,
M. A. Kraaijveld,
Lucas J. van Vliet,
E. P. Reding,
Piet W. Verbeek,
H. J. Lammers:
Robust Curve Detection Using a Radon Transform in Orientation Space.
SCIA 2003: 125-132 |
| 2001 |
|---|
| 2 | EE | Joost van de Weijer,
Lucas J. van Vliet,
Piet W. Verbeek,
Michael van Ginkel:
Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.
IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001) |
| 2000 |
|---|
| 1 | EE | Ian T. Young,
Lucas J. van Vliet,
Michael van Ginkel:
Recursive Gabor Filtering.
ICPR 2000: 3342-3345 |
