| |
| 2003 | ||
|---|---|---|
| 1 | EE | Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek: A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156 |
| 1 | Judith Dijk | [1] |
| 2 | Michael van Ginkel | [1] |
| 3 | Piet W. Verbeek | [1] |
| 4 | Lucas J. van Vliet | [1] |