2005 |
25 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The generalized Radon transform: Sampling, accuracy and memory considerations.
Pattern Recognition 38(12): 2494-2505 (2005) |
2004 |
24 | | Lucas J. van Vliet,
Piet W. Verbeek,
Ian T. Young:
Quantitative Imaging: How to Measure Size Features in Digitized Images.
ISBI 2004: 1227-1230 |
23 | EE | Bernd Rieger,
Frederik J. Timmermans,
Lucas J. van Vliet,
Piet W. Verbeek:
On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors.
IEEE Trans. Pattern Anal. Mach. Intell. 26(8): 1088-1094 (2004) |
2003 |
22 | EE | Judith Dijk,
Michael van Ginkel,
Rutger J. van Asselt,
Lucas J. van Vliet,
Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges.
CAIP 2003: 149-156 |
21 | EE | Cris L. Luengo Hendriks,
Michael van Ginkel,
Piet W. Verbeek,
Lucas J. van Vliet:
The Generalised Radon Transform: Sampling and Memory Considerations.
CAIP 2003: 681-688 |
20 | EE | Piet W. Verbeek,
Judith Dijk:
The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement.
CAIP 2003: 738-745 |
19 | EE | Michael van Ginkel,
M. A. Kraaijveld,
Lucas J. van Vliet,
E. P. Reding,
Piet W. Verbeek,
H. J. Lammers:
Robust Curve Detection Using a Radon Transform in Orientation Space.
SCIA 2003: 125-132 |
18 | EE | Bernd Rieger,
Lucas J. van Vliet,
Piet W. Verbeek:
Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images.
SCIA 2003: 262-267 |
2002 |
17 | EE | Bernd Rieger,
Frederik J. Timmermans,
Lucas J. van Vliet,
Piet W. Verbeek:
Curvature Estimation of Surfaces in 3D Grey-Value Images.
ICPR (1) 2002: 684-687 |
2001 |
16 | | Peter Bakker,
Lucas J. van Vliet,
Piet W. Verbeek:
Confidence and Curvature Estimation of Curvilinear Structures in 3-D.
ICCV 2001: 139-144 |
15 | EE | Joost van de Weijer,
Lucas J. van Vliet,
Piet W. Verbeek,
Michael van Ginkel:
Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.
IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001) |
2000 |
14 | EE | René G. de Vries,
Piet W. Verbeek:
Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images.
ICPR 2000: 7026-7029 |
1999 |
13 | EE | Peter Bakker,
Lucas J. van Vliet,
Piet W. Verbeek:
Edge Preserving Orientation Adaptive Filtering.
CVPR 1999: 1535-1540 |
12 | EE | Dick de Ridder,
Robert P. W. Duin,
Piet W. Verbeek:
The Applicability of Neural Networks to Non-linear Image Processing.
Pattern Anal. Appl. 2(2): 111-128 (1999) |
1998 |
11 | | Dick de Ridder,
Robert P. W. Duin,
Piet W. Verbeek,
Lucas J. van Vliet:
On the Application of Neural Networks to Non-Linear Image Processing Tasks.
ICONIP 1998: 161-165 |
1997 |
10 | EE | Michiel de Bakker,
Piet W. Verbeek,
Gijs K. Steenvoorden:
Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer.
3DIM 1997: 11-18 |
1994 |
9 | EE | Piet W. Verbeek,
Lucas J. van Vliet:
On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images.
IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 726-733 (1994) |
8 | EE | Lucas J. van Vliet,
Piet W. Verbeek:
Edge localization by MoG filters: Multiple-of-Gaussians.
Pattern Recognition Letters 15(5): 485-496 (1994) |
1993 |
7 | | Ben J. H. Verwer,
Lucas J. van Vliet,
Piet W. Verbeek:
Binary and Grey-Value Skeletons: Metrics and Algorithms.
IJPRAI 7(5): 1287-1308 (1993) |
1990 |
6 | EE | Piet W. Verbeek,
Ben J. H. Verwer:
Shading from shape, the eikonal equation solved by grey-weighted distance transform.
Pattern Recognition Letters 11(10): 681-690 (1990) |
1989 |
5 | EE | Ben J. H. Verwer,
Piet W. Verbeek,
Simon T. Dekker:
An Efficient Uniform Cost Algorithm Applied to Distance Transforms.
IEEE Trans. Pattern Anal. Mach. Intell. 11(4): 425-429 (1989) |
1986 |
4 | | Piet W. Verbeek,
Leo Dorst,
Ben J. H. Verwer,
Frans C. A. Groen:
Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space.
IAS 1986: 627-634 |
1984 |
3 | EE | Frans A. Gerritsen,
Piet W. Verbeek:
Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware.
Computer Vision, Graphics, and Image Processing 27(1): 115-123 (1984) |
1981 |
2 | EE | Frans C. A. Groen,
Piet W. Verbeek,
N. de Jong,
J. W. Klumper:
The smallest box around a package.
Pattern Recognition 14(1-6): 173-178 (1981) |
1977 |
1 | | Frans C. A. Groen,
Piet W. Verbeek,
M. van der Ploeg:
Computation of DNA-based parameters from chromosome scans.
Digital Image Processing 1977: 21-30 |