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Piet W. Verbeek

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2005
25EECris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet: The generalized Radon transform: Sampling, accuracy and memory considerations. Pattern Recognition 38(12): 2494-2505 (2005)
2004
24 Lucas J. van Vliet, Piet W. Verbeek, Ian T. Young: Quantitative Imaging: How to Measure Size Features in Digitized Images. ISBI 2004: 1227-1230
23EEBernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek: On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 26(8): 1088-1094 (2004)
2003
22EEJudith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek: A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156
21EECris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet: The Generalised Radon Transform: Sampling and Memory Considerations. CAIP 2003: 681-688
20EEPiet W. Verbeek, Judith Dijk: The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement. CAIP 2003: 738-745
19EEMichael van Ginkel, M. A. Kraaijveld, Lucas J. van Vliet, E. P. Reding, Piet W. Verbeek, H. J. Lammers: Robust Curve Detection Using a Radon Transform in Orientation Space. SCIA 2003: 125-132
18EEBernd Rieger, Lucas J. van Vliet, Piet W. Verbeek: Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images. SCIA 2003: 262-267
2002
17EEBernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek: Curvature Estimation of Surfaces in 3D Grey-Value Images. ICPR (1) 2002: 684-687
2001
16 Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek: Confidence and Curvature Estimation of Curvilinear Structures in 3-D. ICCV 2001: 139-144
15EEJoost van de Weijer, Lucas J. van Vliet, Piet W. Verbeek, Michael van Ginkel: Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields. IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001)
2000
14EERené G. de Vries, Piet W. Verbeek: Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images. ICPR 2000: 7026-7029
1999
13EEPeter Bakker, Lucas J. van Vliet, Piet W. Verbeek: Edge Preserving Orientation Adaptive Filtering. CVPR 1999: 1535-1540
12EEDick de Ridder, Robert P. W. Duin, Piet W. Verbeek: The Applicability of Neural Networks to Non-linear Image Processing. Pattern Anal. Appl. 2(2): 111-128 (1999)
1998
11 Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek, Lucas J. van Vliet: On the Application of Neural Networks to Non-Linear Image Processing Tasks. ICONIP 1998: 161-165
1997
10EEMichiel de Bakker, Piet W. Verbeek, Gijs K. Steenvoorden: Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer. 3DIM 1997: 11-18
1994
9EEPiet W. Verbeek, Lucas J. van Vliet: On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images. IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 726-733 (1994)
8EELucas J. van Vliet, Piet W. Verbeek: Edge localization by MoG filters: Multiple-of-Gaussians. Pattern Recognition Letters 15(5): 485-496 (1994)
1993
7 Ben J. H. Verwer, Lucas J. van Vliet, Piet W. Verbeek: Binary and Grey-Value Skeletons: Metrics and Algorithms. IJPRAI 7(5): 1287-1308 (1993)
1990
6EEPiet W. Verbeek, Ben J. H. Verwer: Shading from shape, the eikonal equation solved by grey-weighted distance transform. Pattern Recognition Letters 11(10): 681-690 (1990)
1989
5EEBen J. H. Verwer, Piet W. Verbeek, Simon T. Dekker: An Efficient Uniform Cost Algorithm Applied to Distance Transforms. IEEE Trans. Pattern Anal. Mach. Intell. 11(4): 425-429 (1989)
1986
4 Piet W. Verbeek, Leo Dorst, Ben J. H. Verwer, Frans C. A. Groen: Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space. IAS 1986: 627-634
1984
3EEFrans A. Gerritsen, Piet W. Verbeek: Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware. Computer Vision, Graphics, and Image Processing 27(1): 115-123 (1984)
1981
2EEFrans C. A. Groen, Piet W. Verbeek, N. de Jong, J. W. Klumper: The smallest box around a package. Pattern Recognition 14(1-6): 173-178 (1981)
1977
1 Frans C. A. Groen, Piet W. Verbeek, M. van der Ploeg: Computation of DNA-based parameters from chromosome scans. Digital Image Processing 1977: 21-30

Coauthor Index

1Rutger J. van Asselt [22]
2Michiel de Bakker [10]
3Peter Bakker [13] [16]
4Simon T. Dekker [5]
5Judith Dijk [20] [22]
6Leo Dorst [4]
7Robert P. W. Duin [11] [12]
8Frans A. Gerritsen [3]
9Michael van Ginkel [15] [19] [21] [22] [25]
10Frans C. A. Groen [1] [2] [4]
11Cris L. Luengo Hendriks [21] [25]
12N. de Jong [2]
13J. W. Klumper [2]
14M. A. Kraaijveld [19]
15H. J. Lammers [19]
16M. van der Ploeg [1]
17E. P. Reding [19]
18Dick de Ridder [11] [12]
19Bernd Rieger [17] [18] [23]
20Gijs K. Steenvoorden [10]
21Frederik J. Timmermans [17] [23]
22Ben J. H. Verwer [4] [5] [6] [7]
23Lucas J. van Vliet [7] [8] [9] [11] [13] [15] [16] [17] [18] [19] [21] [22] [23] [24] [25]
24René G. de Vries [14]
25Joost van de Weijer [15]
26Ian T. Young [24]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)