| 2008 |
|---|
| 5 | EE | Anderson Mwegerano,
Pekka Kytösaho,
Timo Liukkonen,
Aulis Tuominen:
Characterization of resolution cycle times of corrective actions in mobile terminals.
Quality and Reliability Eng. Int. 24(5): 613-621 (2008) |
| 2004 |
|---|
| 4 | EE | Teija Uusluoto,
Paavo Jalonen,
Harri Laaksonen,
Aulis Tuominen:
Metallization of microvias by sputter-deposition.
Microelectronics Reliability 44(4): 587-593 (2004) |
| 2003 |
|---|
| 3 | EE | Timo Liukkonen,
Aulis Tuominen:
Decreasing variation in paste printing using statistical process control.
Microelectronics Reliability 43(7): 1157-1161 (2003) |
| 2002 |
|---|
| 2 | EE | Paavo Jalonen,
Aulis Tuominen:
The effect of sputtered interface metallic layers on reinforced core laminate making build-up structures.
Microelectronics Reliability 42(7): 1075-1079 (2002) |
| 2001 |
|---|
| 1 | EE | Petteri Palm,
Jarmo Määttänen,
Aulis Tuominen,
Eero Ristolainen:
Reliability of 80 mum pitch flip chip attachment on flex.
Microelectronics Reliability 41(5): 633-638 (2001) |
