2008 | ||
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2 | EE | Anderson Mwegerano, Pekka Kytösaho, Timo Liukkonen, Aulis Tuominen: Characterization of resolution cycle times of corrective actions in mobile terminals. Quality and Reliability Eng. Int. 24(5): 613-621 (2008) |
2003 | ||
1 | EE | Timo Liukkonen, Aulis Tuominen: Decreasing variation in paste printing using statistical process control. Microelectronics Reliability 43(7): 1157-1161 (2003) |
1 | Pekka Kytösaho | [2] |
2 | Anderson Mwegerano | [2] |
3 | Aulis Tuominen | [1] [2] |