| |
| 1992 | ||
|---|---|---|
| 2 | EE | Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler: A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992) |
| 1989 | ||
| 1 | Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz: Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479 | |
| 1 | Thomas M. Sarfert | [1] [2] |
| 2 | Michael H. Schulz | [1] [2] |
| 3 | Erwin Trischler | [1] [2] |