1992 |
13 | | Franz Fink,
Karl Fuchs,
Michael H. Schulz:
Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns.
IEEE Trans. Computers 41(12): 1527-1536 (1992) |
12 | EE | Thomas M. Sarfert,
Remo G. Markgraf,
Michael H. Schulz,
Erwin Trischler:
A hierarchical test pattern generation system based on high-level primitives.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992) |
11 | | Hans-Joachim Wunderlich,
Michael H. Schulz:
Prüfgerechter Entwurf und Test hochintegrierter Schaltungen.
Informatik Spektrum 15(1): 23-32 (1992) |
1991 |
10 | EE | Elisabeth Auth,
Michael H. Schulz:
A Test-Pattern-Generation Algorithm for Sequential Circuits.
IEEE Design & Test of Computers 8(2): 72-86 (1991) |
9 | EE | Karl Fuchs,
Franz Fink,
Michael H. Schulz:
DYNAMITE: an efficient automatic test pattern generation system for path delay faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(10): 1323-1335 (1991) |
1990 |
8 | | Bernhard H. Seiß,
Michael H. Schulz:
Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen.
Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme 1990: 195-206 |
1989 |
7 | EE | Michael H. Schulz,
Franz Fink,
Karl Fuchs:
Parallel Pattern Fault Simulation of Path Delay Faults.
DAC 1989: 357-363 |
6 | | Michael H. Schulz,
Elisabeth Auth:
Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits.
ITC 1989: 28-37 |
5 | | Thomas M. Sarfert,
Remo G. Markgraf,
Erwin Trischler,
Michael H. Schulz:
Hierarchical Test Pattern Generation Based on High-Level Primitives.
ITC 1989: 470-479 |
4 | EE | Michael H. Schulz,
Elisabeth Auth:
Improved deterministic test pattern generation with applications to redundancy identification.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989) |
1988 |
3 | | Michael H. Schulz:
Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität
Springer 1988 |
2 | EE | Michael H. Schulz,
Erwin Trischler,
Thomas M. Sarfert:
SOCRATES: a highly efficient automatic test pattern generation system.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 126-137 (1988) |
1987 |
1 | EE | Kurt Antreich,
Michael H. Schulz:
Accelerated Fault Simulation and Fault Grading in Combinational Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(5): 704-712 (1987) |