| 2004 |
|---|
| 7 | EE | Mike Tripp:
ITC 2004 Panel: Cost of Test - Taking Control.
ITC 2004: 1432 |
| 6 | EE | T. M. Mak,
Mike Tripp,
Anne Meixner:
Testing Gbps Interfaces without a Gigahertz Tester.
IEEE Design & Test of Computers 21(4): 278-286 (2004) |
| 2003 |
|---|
| 5 | EE | Mike Tripp,
T. M. Mak,
Anne Meixner:
Elimination of Traditional Functional Testing of Interface Timings at Intel.
ITC 2003: 1014-1022 |
| 4 | EE | Mike Tripp,
T. M. Mak,
Anne Meixner:
Elimination of Traditional Functional Testing of Interface Timings at Intel.
ITC 2003: 1448-1456 |
| 2002 |
|---|
| 3 | EE | Mike Tripp:
Challenges and Solutions for Multi-Gigahertz Testing .
ITC 2002: 1232 |
| 2 | EE | Mike Mayberry,
John Johnson,
Navid Shahriari,
Mike Tripp:
Realizing the Benefits of Structural Test for Intel Microprocessors.
ITC 2002: 456-463 |
| 2001 |
|---|
| 1 | EE | Pete O'Neill,
Ron Richmond,
Mike Tripp,
Barbara Vasquez,
Art Wager,
Zeev Weinberg:
Reliability Beyond GHz.
VTS 2001: 413-414 |
