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Pete O'Neill

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2002
4EEMinh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill: Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC 2002: 683-692
2001
3EEPete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg: Reliability Beyond GHz. VTS 2001: 413-414
2000
2 Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production IDDQ testing. ITC 2000: 1148-1156
1999
1 Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production I_DDQ testing. ITC 1999: 738-746

Coauthor Index

1Robert C. Aitken [1] [2]
2Ronald Dudley [1] [2]
3Tim Figal [4]
4Neal Jaarsma [1] [2]
5Bob Kopitzke [4]
6Peter C. Maxwell [1] [2]
7Tuan Pham [4]
8Minh Quach [1] [2] [4]
9Ron Richmond [3]
10Mike Tripp [3]
11Barbara Vasquez [3]
12Art Wager [3]
13Zeev Weinberg [3]
14Don Wiseman [1] [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)