2002 |
4 | EE | Minh Quach,
Tuan Pham,
Tim Figal,
Bob Kopitzke,
Pete O'Neill:
Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation.
ITC 2002: 683-692 |
2001 |
3 | EE | Pete O'Neill,
Ron Richmond,
Mike Tripp,
Barbara Vasquez,
Art Wager,
Zeev Weinberg:
Reliability Beyond GHz.
VTS 2001: 413-414 |
2000 |
2 | | Peter C. Maxwell,
Pete O'Neill,
Robert C. Aitken,
Ronald Dudley,
Neal Jaarsma,
Minh Quach,
Don Wiseman:
Current ratios: a self-scaling technique for production IDDQ testing.
ITC 2000: 1148-1156 |
1999 |
1 | | Peter C. Maxwell,
Pete O'Neill,
Robert C. Aitken,
Ronald Dudley,
Neal Jaarsma,
Minh Quach,
Don Wiseman:
Current ratios: a self-scaling technique for production I_DDQ testing.
ITC 1999: 738-746 |