Mike Mayberry
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2002
1
EE
Mike Mayberry,
John Johnson
,
Navid Shahriari
,
Mike Tripp
: Realizing the Benefits of Structural Test for Intel Microprocessors.
ITC 2002
: 456-463
Coauthor
Index
1
John Johnson
[
1
]
2
Navid Shahriari
[
1
]
3
Mike Tripp
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
