| |
| 2006 | ||
|---|---|---|
| 3 | EE | A. Altes, R. Tilgner, W. Walter: Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity. Microelectronics Reliability 46(9-11): 1525-1529 (2006) |
| 2003 | ||
| 2 | EE | P. Rajamand, R. Tilgner, R. Schmidt, J. Baumann, P. Klofac, M. Rothenfusser: Investigation of delaminations during thermal stress: scanning acoustic microscopy covering low and high temperatures. Microelectronics Reliability 43(9-11): 1815-1820 (2003) |
| 1979 | ||
| 1 | R. Tilgner, Achim von Brandt, Friedrich M. Wahl: Erfahrungen mit Relaxationsverfahren zur Kantendetektion. DAGM-Symposium 1979: 129-136 | |
| 1 | A. Altes | [3] |
| 2 | J. Baumann | [2] |
| 3 | Achim von Brandt | [1] |
| 4 | P. Klofac | [2] |
| 5 | P. Rajamand | [2] |
| 6 | M. Rothenfusser | [2] |
| 7 | R. Schmidt | [2] |
| 8 | Friedrich M. Wahl | [1] |
| 9 | W. Walter | [3] |