2005 | ||
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2 | EE | S. Krimmel, J. Baumann, Zoltán Kiss, Attila Kuba, Antal Nagy, J. Stephan: Discrete tomography for reconstruction from limited view angles in non-destructive testing. Electronic Notes in Discrete Mathematics 20: 455-474 (2005) |
2003 | ||
1 | EE | P. Rajamand, R. Tilgner, R. Schmidt, J. Baumann, P. Klofac, M. Rothenfusser: Investigation of delaminations during thermal stress: scanning acoustic microscopy covering low and high temperatures. Microelectronics Reliability 43(9-11): 1815-1820 (2003) |
1 | Zoltán Kiss | [2] |
2 | P. Klofac | [1] |
3 | S. Krimmel | [2] |
4 | Attila Kuba | [2] |
5 | Antal Nagy | [2] |
6 | P. Rajamand | [1] |
7 | M. Rothenfusser | [1] |
8 | R. Schmidt | [1] |
9 | J. Stephan | [2] |
10 | R. Tilgner | [1] |