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| 2006 | ||
|---|---|---|
| 1 | EE | A. Altes, R. Tilgner, W. Walter: Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity. Microelectronics Reliability 46(9-11): 1525-1529 (2006) |
| 1 | A. Altes | [1] |
| 2 | R. Tilgner | [1] |