A. Altes

2006
2	EE	A. Altes, R. Tilgner, W. Walter: Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity. Microelectronics Reliability 46(9-11): 1525-1529 (2006)
2002
1	EE	T. H. Lee, X. Guo, G. D. Shen, Y. Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk: Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM). Microelectronics Reliability 42(9-11): 1711-1714 (2002)

Coauthor Index

1	L. J. Balk	[1]
2	J. Y. Du	[1]
3	G. Gao	[1]
4	X. Guo	[1]
5	Y. Ji	[1]
6	T. H. Lee	[1]
7	G. D. Shen	[1]
8	R. Tilgner	[2]
9	W. Walter	[2]
10	G. H. Wang	[1]
11	X. Z. Wang	[1]

Colors in the list of coauthors