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2002 | ||
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1 | EE | Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up. VTS 2002: 177-180 |
1 | Rob Aitken | [1] |
2 | S. Eichenberge | [1] |
3 | M. Millegen | [1] |
4 | Julie Segal | [1] |
5 | R. Seger | [1] |
6 | Rene Segers | [1] |
7 | S. Venkataraman | [1] |