D. C. L. Van Geest
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2004
1
EE
Rodger Schuttert
, D. C. L. Van Geest,
A. Kumar
: On-Chip Mixed-Signal Test Structures Re-used for Board Test.
ITC 2004
: 375-383
Coauthor
Index
1
A. Kumar
[
1
]
2
Rodger Schuttert
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
