1998 | ||
---|---|---|
2 | EE | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer: Testing a multichip package for a consumer communications application. ITC 1998: 222-227 |
1993 | ||
1 | Math Muris, Alex S. Biewenga: Using Boundary Scan Test to Test Random Access Memory Clusters. ITC 1993: 174-179 |
1 | Alex S. Biewenga | [1] [2] |
2 | Urs Fawer | [2] |
3 | Rodger Schuttert | [2] |