| |
| 2001 | ||
|---|---|---|
| 3 | F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers: Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479 | |
| 1998 | ||
| 2 | EE | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer: Testing a multichip package for a consumer communications application. ITC 1998: 222-227 |
| 1993 | ||
| 1 | Math Muris, Alex S. Biewenga: Using Boundary Scan Test to Test Random Access Memory Clusters. ITC 1993: 174-179 | |
| 1 | Urs Fawer | [2] |
| 2 | D. C. L. van Geest | [3] |
| 3 | F. G. M. de Jong | [3] |
| 4 | Math Muris | [1] [2] |
| 5 | Rodger Schuttert | [2] |
| 6 | T. F. Waayers | [3] |