| |
| 1991 | ||
|---|---|---|
| 3 | EE | Elisabeth Auth, Michael H. Schulz: A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Design & Test of Computers 8(2): 72-86 (1991) |
| 1989 | ||
| 2 | Michael H. Schulz, Elisabeth Auth: Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989: 28-37 | |
| 1 | EE | Michael H. Schulz, Elisabeth Auth: Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989) |
| 1 | Michael H. Schulz | [1] [2] [3] |