1991 |
3 | EE | Elisabeth Auth,
Michael H. Schulz:
A Test-Pattern-Generation Algorithm for Sequential Circuits.
IEEE Design & Test of Computers 8(2): 72-86 (1991) |
1989 |
2 | | Michael H. Schulz,
Elisabeth Auth:
Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits.
ITC 1989: 28-37 |
1 | EE | Michael H. Schulz,
Elisabeth Auth:
Improved deterministic test pattern generation with applications to redundancy identification.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989) |