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Elisabeth Auth

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1991
3EEElisabeth Auth, Michael H. Schulz: A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Design & Test of Computers 8(2): 72-86 (1991)
1989
2 Michael H. Schulz, Elisabeth Auth: Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989: 28-37
1EEMichael H. Schulz, Elisabeth Auth: Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989)

Coauthor Index

1Michael H. Schulz [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)