| 2007 |
|---|
| 10 | EE | Stephane Bronckers,
Charlotte Soens,
Geert Van der Plas,
Gerd Vandersteen,
Yves Rolain:
Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's.
DATE 2007: 1520-1525 |
| 9 | EE | Jonathan Borremans,
Ludwig De Locht,
Piet Wambacq,
Yves Rolain:
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis.
DATE 2007: 261-266 |
| 2006 |
|---|
| 8 | EE | Gerd Vandersteen,
Stephane Bronckers,
Petr Dobrovolný,
Yves Rolain:
Systematic stability-analysis method for analog circuits.
DATE 2006: 150-155 |
| 7 | EE | Johan Schoukens,
Yves Rolain,
Rik Pintelon:
Analysis of windowing/leakage effects in frequency response function measurements.
Automatica 42(1): 27-38 (2006) |
| 6 | EE | Rik Pintelon,
Yves Rolain,
Johan Schoukens:
Box-Jenkins identification revisited - Part II: Applications.
Automatica 42(1): 77-84 (2006) |
| 2005 |
|---|
| 5 | EE | Gerd Vandersteen,
Ludwig De Locht,
Snezana Jenei,
Yves Rolain,
Rik Pintelon:
Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework.
DATE 2005: 1076-1081 |
| 4 | EE | Johan Schoukens,
Rik Pintelon,
Tadeusz Dobrowiecki,
Yves Rolain:
Identification of linear systems with nonlinear distortions.
Automatica 41(3): 491-504 (2005) |
| 2004 |
|---|
| 3 | EE | Johan Schoukens,
Rik Pintelon,
Yves Rolain:
Box-Jenkins alike identification using nonparametric noise models.
Automatica 40(12): 2083-2089 (2004) |
| 2001 |
|---|
| 2 | EE | Gerd Vandersteen,
Piet Wambacq,
Yves Rolain,
Johan Schoukens,
Stéphane Donnay,
Marc Engels,
Ivo Bolsens:
Efficient bit-error-rate estimation of multicarrier transceivers.
DATE 2001: 164-168 |
| 2000 |
|---|
| 1 | EE | Gerd Vandersteen,
Piet Wambacq,
Yves Rolain,
Petr Dobrovolný,
Stéphane Donnay,
Marc Engels,
Ivo Bolsens:
A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers.
DAC 2000: 440-445 |
