| 2008 |
|---|
| 5 | EE | David F. Heidel,
Jack Hergenrother,
Kenneth P. Rodbell:
Preface.
IBM Journal of Research and Development 52(3): 223-224 (2008) |
| 4 | EE | David F. Heidel,
Kenneth P. Rodbell,
Ethan H. Cannon,
Cyril Cabral Jr.,
Michael S. Gordon,
Phil Oldiges,
Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM Journal of Research and Development 52(3): 225-232 (2008) |
| 3 | EE | Henry H. K. Tang,
Conal E. Murray,
Giovanni Fiorenza,
Kenneth P. Rodbell,
Michael S. Gordon,
David F. Heidel:
New simulation methodology for effects of radiation in semiconductor chip structures.
IBM Journal of Research and Development 52(3): 245-254 (2008) |
| 2 | EE | Michael S. Gordon,
Kenneth P. Rodbell,
David F. Heidel,
Cyril Cabral Jr.,
Ethan H. Cannon,
Daniel D. Reinhardt:
Single-event-upset and alpha-particle emission rate measurement techniques.
IBM Journal of Research and Development 52(3): 265-274 (2008) |
| 1995 |
|---|
| 1 | | Chao-Kun Hu,
Kenneth P. Rodbell,
Timothy D. Sullivan,
Kim Y. Lee,
Dennis P. Bouldin:
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines.
IBM Journal of Research and Development 39(4): 465-498 (1995) |
