| 2008 |
|---|
| 4 | EE | David F. Heidel,
Kenneth P. Rodbell,
Ethan H. Cannon,
Cyril Cabral Jr.,
Michael S. Gordon,
Phil Oldiges,
Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM Journal of Research and Development 52(3): 225-232 (2008) |
| 3 | EE | A. J. KleinOsowski,
Ethan H. Cannon,
Phil Oldiges,
Larry Wissel:
Circuit design and modeling for soft errors.
IBM Journal of Research and Development 52(3): 255-264 (2008) |
| 2 | EE | Michael S. Gordon,
Kenneth P. Rodbell,
David F. Heidel,
Cyril Cabral Jr.,
Ethan H. Cannon,
Daniel D. Reinhardt:
Single-event-upset and alpha-particle emission rate measurement techniques.
IBM Journal of Research and Development 52(3): 265-274 (2008) |
| 1 | EE | Jude A. Rivers,
Pradip Bose,
Prabhakar Kudva,
John-David Wellman,
Pia N. Sanda,
Ethan H. Cannon,
Luiz C. Alves:
Phaser: Phased methodology for modeling the system-level effects of soft errors.
IBM Journal of Research and Development 52(3): 293-306 (2008) |
