2008 |
4 | EE | David F. Heidel,
Kenneth P. Rodbell,
Ethan H. Cannon,
Cyril Cabral Jr.,
Michael S. Gordon,
Phil Oldiges,
Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM Journal of Research and Development 52(3): 225-232 (2008) |
3 | EE | Henry H. K. Tang,
Conal E. Murray,
Giovanni Fiorenza,
Kenneth P. Rodbell,
Michael S. Gordon,
David F. Heidel:
New simulation methodology for effects of radiation in semiconductor chip structures.
IBM Journal of Research and Development 52(3): 245-254 (2008) |
2 | EE | Michael S. Gordon,
Kenneth P. Rodbell,
David F. Heidel,
Cyril Cabral Jr.,
Ethan H. Cannon,
Daniel D. Reinhardt:
Single-event-upset and alpha-particle emission rate measurement techniques.
IBM Journal of Research and Development 52(3): 265-274 (2008) |
2001 |
1 | EE | Rajinder S. Dhaliwal,
William A. Enichen,
Steven D. Golladay,
Michael S. Gordon,
Rodney A. Kendall,
Jon E. Lieberman,
Hans C. Pfeiffer,
David J. Pinckney,
Christopher F. Robinson,
James D. Rockrohr,
Werner Stickel,
Eileen V. Tressler:
PREVAIL-Electron projection technology approach for next-generation lithography.
IBM Journal of Research and Development 45(5): 615-638 (2001) |