2008 |
4 | EE | David F. Heidel,
Kenneth P. Rodbell,
Ethan H. Cannon,
Cyril Cabral Jr.,
Michael S. Gordon,
Phil Oldiges,
Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology.
IBM Journal of Research and Development 52(3): 225-232 (2008) |
3 | EE | Michael S. Gordon,
Kenneth P. Rodbell,
David F. Heidel,
Cyril Cabral Jr.,
Ethan H. Cannon,
Daniel D. Reinhardt:
Single-event-upset and alpha-particle emission rate measurement techniques.
IBM Journal of Research and Development 52(3): 265-274 (2008) |
1999 |
2 | EE | David E. Kotecki,
John D. Baniecki,
Hua Shen,
Robert B. Laibowitz,
Katherine L. Saenger,
Jingyu Jenny Lian,
Thomas M. Shaw,
Satish D. Athavale,
Cyril Cabral Jr.,
Peter R. Duncombe,
Martin Gutsche,
Gerhard Kunkel,
Young-Jin Park,
Yun-Yu Wang,
Richard Wise:
(Ba, Sr)TiO3 dielectrics for future stacked- capacitor DRAM.
IBM Journal of Research and Development 43(3): 367-382 (1999) |
1998 |
1 | EE | Hiroshi Takatsuji,
Evan G. Colgan,
Cyril Cabral Jr.,
James M. E. Harper:
Evaluation of Al(Nd)-alloy films for application to thin-film-transistor liquid crystal displays.
IBM Journal of Research and Development 42(3): 501-508 (1998) |