Sue Ann Ung

2005
2	EE	John C. Koob, Sue Ann Ung, Ashwin S. Rao, Daniel A. Leder, Craig S. Joly, Kristopher C. Breen, Tyler L. Brandon, Michael Hume, Bruce F. Cockburn, Duncan G. Elliott: Test and Characterization of a Variable-Capacity Multilevel DRAM. VTS 2005: 189-197
2002
1	EE	Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott, Yunan Xiang, Sue Ann Ung: Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. MTDT 2002: 117-122

Coauthor Index

1	Tyler L. Brandon	[2]
2	Kristopher C. Breen	[2]
3	Bruce F. Cockburn	[1] [2]
4	Duncan G. Elliott	[1] [2]
5	Michael Hume	[2]
6	Craig S. Joly	[2]
7	John C. Koob	[2]
8	Daniel A. Leder	[2]
9	Ashwin S. Rao	[2]
10	Michael Redeker	[1]
11	Yunan Xiang	[1]