| 2008 |
|---|
| 3 | EE | Ramyanshu Datta,
Ravi Gupta,
Antony Sebastine,
Jacob A. Abraham,
Manuel A. d'Abreu:
Controllability of Static CMOS Circuits for Timing Characterization.
J. Electronic Testing 24(5): 481-496 (2008) |
| 2004 |
|---|
| 2 | EE | Ramyanshu Datta,
Antony Sebastine,
Ashwin Raghunathan,
Jacob A. Abraham:
On-chip delay measurement for silicon debug.
ACM Great Lakes Symposium on VLSI 2004: 145-148 |
| 1 | EE | Ramyanshu Datta,
Ravi Gupta,
Antony Sebastine,
Jacob A. Abraham,
Manuel A. d'Abreu:
Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing.
ITC 2004: 1118-1127 |
