| |
| 2004 | ||
|---|---|---|
| 1 | EE | J. C. Wang, Paulo Sérgio Cardoso, J. A. Q. Gonzalez, Marius Strum, R. Pires: Datapath BIST Insertion Using Pre-Characterized Area and Testability Data. J. Electronic Testing 20(4): 333-344 (2004) |
| 1 | Paulo Sérgio Cardoso | [1] |
| 2 | R. Pires | [1] |
| 3 | Marius Strum | [1] |
| 4 | J. C. Wang | [1] |