2006 |
3 | EE | V. S. Pershenkov,
A. D. Tremasov,
V. V. Belyakov,
A. U. Razvalyaev,
V. S. Mochkin:
X-ray ion mobility spectrometer.
Microelectronics Reliability 46(2-4): 641-644 (2006) |
2002 |
2 | EE | V. S. Pershenkov,
S. V. Avdeev,
A. S. Tsimbalov,
M. N. Levin,
V. V. Belyakov,
D. V. Ivashin,
A. Y. Slesarev,
A. Y. Bashin,
G. I. Zebrev,
V. N. Ulimov:
Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response.
Microelectronics Reliability 42(4-5): 797-804 (2002) |
2001 |
1 | EE | M. N. Levin,
V. R. Gitlin,
S. G. Kadmensky,
S. S. Ostrouhov,
V. S. Pershenkov:
X-ray and UV controlled adjustment of MOS VLSI circuits threshold voltages.
Microelectronics Reliability 41(2): 185-191 (2001) |