V. V. Belyakov

2006
2	EE	V. S. Pershenkov, A. D. Tremasov, V. V. Belyakov, A. U. Razvalyaev, V. S. Mochkin: X-ray ion mobility spectrometer. Microelectronics Reliability 46(2-4): 641-644 (2006)
2002
1	EE	V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, G. I. Zebrev, V. N. Ulimov: Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response. Microelectronics Reliability 42(4-5): 797-804 (2002)

Coauthor Index

1	S. V. Avdeev	[1]
2	A. Y. Bashin	[1]
3	D. V. Ivashin	[1]
4	M. N. Levin	[1]
5	V. S. Mochkin	[2]
6	V. S. Pershenkov	[1] [2]
7	A. U. Razvalyaev	[2]
8	A. Y. Slesarev	[1]
9	A. D. Tremasov	[2]
10	A. S. Tsimbalov	[1]
11	V. N. Ulimov	[1]
12	G. I. Zebrev	[1]